Recently published articles: D. Kucharski, A. Gąska, T. Kowaluk, K. Stępień, M. Rępalska, B. Gapiński, M. Wieczorowski, M. Nawotka, P. Sobecki, P. Sosinowski, J. Tomasik, A. Wójtowicz, Multi-Task Deep Learning for Surface Metrology, Sensors 25 (2025) 7471. https://doi.org/10.3390/s25247471.
Kucharski, D. & Wieczorowski, M. Radial image processing for phase extraction in rough-surface interferometry. Measurement 117102 (2025) doi:10.1016/j.measurement.2025.117102